EM - SEM Sample Mounting

Created by Karen Darley, Modified on Wed, 2 Apr at 8:44 AM by Karen Darley

SEM mount grippersHere are 4 different methods for clean and effective mounting of various types of samples for SEM.


1) Mounting Samples Using Conductive Adhesives

It is important that the sample is securely fixed to the mount for imaging and analysis. The conductive adhesive surrounding the sample allows a pathway for the negative charge of the electron beam to move away from the specimen to the conductive base of the mount.


Ideal for:

  • Focused ion beam (FIB)
  • Electron backscatter diffraction (EBSD)
  • Atomic force microscopy (AFM)
  • High resolution imaging or high tilt angles


Equipment and Materials:


See more details in the video below by the Microscopy Australia network at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at UNSW Sydney.




2) Mounting Bulk Samples

Bulk samples are a solid piece of material that can be manipulated by hand or by tweezers including resin blocks, petrographic thin sections, wafers, glass, insects parts, metals and composites. It is important that the sample is securely fixed to the mount for imaging and analysis and that there is a pathway for the negative charge of the electron beam to move away from the specimen to the conductive base of the mount.


Equipment and Materials:


See more details in the video below by the Microscopy Australia network at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at UNSW Sydney.

 


3) Mounting Powdered Samples

Powdered samples include substances like pollen, sand and starch. It is important that the sample is securely fixed to the mount for imaging and analysis. The sample also needs to be spread thinly and evenly across the adhesive on the mount to maximise the conductivity of the sample and to ensure there is a pathway for the negative charge of the electron beam to move away from the specimen to the conductive base of the mount. 


Equipment and Materials:


See more details in the video below by the Microscopy Australia network at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at UNSW Sydney.



4) Mounting Nanoparticles or Particles in Suspension

This is for particulate nanomaterials that are 1-100nm in at least one dimension this includes nanospheres, nanocubes, branch nanoparticles, nantubes, nanorods and nanosheets. The sample needs to be spread thinly and evenly across the adhesive on the mount to maximise the conductivity of the sample and to ensure there is a pathway for the negative charge of the electron beam to move away from the specimen to the conductive base of the mount.


Equipment and Materials:



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